Context

Context of Automated inspection and high speed vision architectures : 3-4 November 1987, Cambridge, Massachusetts, Michael J.W. Chen, Rolf-Juergen Ahlers, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ; in association with IEEE Industrial Electronics Society, Society of Instrument and Control Engineers of Japan ; cooperating organizations, Center for Optical Data Processing / Carnegie Mellon University ... (et al.)
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