Coverart for item
The Resource X-ray multilayers for diffractometers, monochromators, and spectrometers : 17-19 August 1988, San Diego, California, Finn E. Christensen, editor ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, Applied Optics Laboratory/New Mexico State University ... (et al.)

X-ray multilayers for diffractometers, monochromators, and spectrometers : 17-19 August 1988, San Diego, California, Finn E. Christensen, editor ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, Applied Optics Laboratory/New Mexico State University ... (et al.)

Label
X-ray multilayers for diffractometers, monochromators, and spectrometers : 17-19 August 1988, San Diego, California
Title
X-ray multilayers for diffractometers, monochromators, and spectrometers
Title remainder
17-19 August 1988, San Diego, California
Statement of responsibility
Finn E. Christensen, editor ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, Applied Optics Laboratory/New Mexico State University ... (et al.)
Contributor
Subject
Genre
Member of
Series statement
Proceedings / SPIE--the International Society for Optical Engineering
Series volume
v. 984
X-ray multilayers for diffractometers, monochromators, and spectrometers : 17-19 August 1988, San Diego, California, Finn E. Christensen, editor ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, Applied Optics Laboratory/New Mexico State University ... (et al.)
Label
X-ray multilayers for diffractometers, monochromators, and spectrometers : 17-19 August 1988, San Diego, California, Finn E. Christensen, editor ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, Applied Optics Laboratory/New Mexico State University ... (et al.)
Publication
Note
'Conference 984 ... was part of a three-conference program on X-Ray Instruments, Multilayers, and Sources held at SPIE's 32nd Annual International Technical Symposium on Optical & Optoelectronic Applied Science & Engineering.'--p. vi
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Bibliography note
Includes bibliographies and index
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Dimensions
28 cm.
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{'f': 'http://opac.lib.rpi.edu/record=b1181757'}
Extent
viii, 271 p.
Isbn
9780819400192
Lccn
88-62305
Other physical details
ill.

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