Coverart for item
The Resource X-ray and electron methods of analysis., Edited by H. Van Olphen and William Parrish
Label
X-ray and electron methods of analysis.
Title
X-ray and electron methods of analysis.
Statement of responsibility
Edited by H. Van Olphen and William Parrish
Creator
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Subject
Member of
Series statement
Progress in analytical chemistry
Series volume
v. 1
X-ray and electron methods of analysis., Edited by H. Van Olphen and William Parrish
Label
X-ray and electron methods of analysis., Edited by H. Van Olphen and William Parrish
Publication
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Bibliography note
Includes bibliographies
Dimensions
24 cm.
http://library.link/vocab/discovery_link
{'f': 'http://opac.lib.rpi.edu/record=b1033626'}
Extent
x, 164 p.
Lccn
68-13392
Other physical details
illus.

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      42.729766 -73.682577
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