Coverart for item
The Resource Wafer-level testing and test during burn-in for integrated circuits, Sudarshan Bahukudumbi, Krishnendu Chakrabarty, (electronic resource)

Wafer-level testing and test during burn-in for integrated circuits, Sudarshan Bahukudumbi, Krishnendu Chakrabarty, (electronic resource)

Label
Wafer-level testing and test during burn-in for integrated circuits
Title
Wafer-level testing and test during burn-in for integrated circuits
Statement of responsibility
Sudarshan Bahukudumbi, Krishnendu Chakrabarty
Creator
Contributor
Subject
Language
eng
Member of
Cataloging source
MiAaPQ
Illustrations
illustrations
Index
index present
Literary form
non fiction
Nature of contents
  • dictionaries
  • bibliography
Series statement
Artech House integrated microsystems series
Wafer-level testing and test during burn-in for integrated circuits, Sudarshan Bahukudumbi, Krishnendu Chakrabarty, (electronic resource)
Label
Wafer-level testing and test during burn-in for integrated circuits, Sudarshan Bahukudumbi, Krishnendu Chakrabarty, (electronic resource)
Link
http://libproxy.rpi.edu/login?url=https://ebookcentral.proquest.com/lib/connectny/detail.action?docID=946559
Publication
Related Contributor
Related Location
Related Agents
Related Authorities
Related Subjects
Related Items
Bibliography note
Includes bibliographical references and index
Color
multicolored
Dimensions
unknown
http://library.link/vocab/discovery_link
{'f': 'http://opac.lib.rpi.edu/record=b4049853'}
Extent
xv, 198 p.
Form of item
  • online
  • electronic
Other physical details
ill.
Reproduction note
Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.
Specific material designation
remote

Library Locations

    • Folsom LibraryBorrow it
      110 8th St, Troy, NY, 12180, US
      42.729766 -73.682577
Processing Feedback ...