Coverart for item
The Resource Very high resolution and quality imaging III : 30 January, 1998, San Jose, California, V. Ralph Algazi, Andrew G. Tescher, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering, IS&T--the Society for Imaging Science and Technology ; published by SPIE--the International Society for Optical Engineering

Very high resolution and quality imaging III : 30 January, 1998, San Jose, California, V. Ralph Algazi, Andrew G. Tescher, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering, IS&T--the Society for Imaging Science and Technology ; published by SPIE--the International Society for Optical Engineering

Label
Very high resolution and quality imaging III : 30 January, 1998, San Jose, California
Title
Very high resolution and quality imaging III
Title remainder
30 January, 1998, San Jose, California
Statement of responsibility
V. Ralph Algazi, Andrew G. Tescher, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering, IS&T--the Society for Imaging Science and Technology ; published by SPIE--the International Society for Optical Engineering
Contributor
Subject
Genre
Language
eng
Member of
Cataloging source
LHL
Illustrations
illustrations
Index
index present
Literary form
non fiction
Nature of contents
bibliography
Series statement
Proceedings / SPIE--the International Society for Optical Engineering
Series volume
v. 3308
Very high resolution and quality imaging III : 30 January, 1998, San Jose, California, V. Ralph Algazi, Andrew G. Tescher, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering, IS&T--the Society for Imaging Science and Technology ; published by SPIE--the International Society for Optical Engineering
Label
Very high resolution and quality imaging III : 30 January, 1998, San Jose, California, V. Ralph Algazi, Andrew G. Tescher, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering, IS&T--the Society for Imaging Science and Technology ; published by SPIE--the International Society for Optical Engineering
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Bibliography note
Includes bibliographical references and author index
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Dimensions
28 cm.
http://library.link/vocab/discovery_link
{'f': 'http://opac.lib.rpi.edu/record=b1349305'}
Extent
v, 124 p.
Isbn
9780819427489
Other physical details
ill.

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