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The Resource Ultrafast laser probe phenomena in bulk and microstructure semiconductors III : 18-19 March 1990, San Diego, California, Robert R. Alfano, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering in cooperation with the Society of Vacuum Coaters

Ultrafast laser probe phenomena in bulk and microstructure semiconductors III : 18-19 March 1990, San Diego, California, Robert R. Alfano, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering in cooperation with the Society of Vacuum Coaters

Label
Ultrafast laser probe phenomena in bulk and microstructure semiconductors III : 18-19 March 1990, San Diego, California
Title
Ultrafast laser probe phenomena in bulk and microstructure semiconductors III
Title remainder
18-19 March 1990, San Diego, California
Statement of responsibility
Robert R. Alfano, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering in cooperation with the Society of Vacuum Coaters
Contributor
Subject
Genre
Member of
Series statement
SPIE proceedings series
Series volume
v. 1282
Ultrafast laser probe phenomena in bulk and microstructure semiconductors III : 18-19 March 1990, San Diego, California, Robert R. Alfano, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering in cooperation with the Society of Vacuum Coaters
Label
Ultrafast laser probe phenomena in bulk and microstructure semiconductors III : 18-19 March 1990, San Diego, California, Robert R. Alfano, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering in cooperation with the Society of Vacuum Coaters
Publication
Note
One of eight sessions of the SPIE Symposium on Advances in Semiconductors and Superconductors: Physics Toward Device Applications, held Mar. 17-21, 1990, in San Diego, Calif
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Bibliography note
Includes bibliographical references and index
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Dimensions
28 cm.
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{'f': 'http://opac.lib.rpi.edu/record=b1212499'}
Extent
viii, 213 p.
Isbn
9780819403339
Lccn
90-61908
Other physical details
ill.

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