Coverart for item
The Resource Two- and three-dimensional vision systems for inspection, control, and metrology : 29-30 October 2003, Providence, Rhode Island, USA, Bruce G. Batchelor, Heinz Hügli, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering

Two- and three-dimensional vision systems for inspection, control, and metrology : 29-30 October 2003, Providence, Rhode Island, USA, Bruce G. Batchelor, Heinz Hügli, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering

Label
Two- and three-dimensional vision systems for inspection, control, and metrology : 29-30 October 2003, Providence, Rhode Island, USA
Title
Two- and three-dimensional vision systems for inspection, control, and metrology
Title remainder
29-30 October 2003, Providence, Rhode Island, USA
Statement of responsibility
Bruce G. Batchelor, Heinz Hügli, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering
Contributor
Subject
Genre
Language
eng
Member of
Cataloging source
LHL
Illustrations
illustrations
Index
index present
Literary form
non fiction
Nature of contents
bibliography
Series statement
SPIE proceedings series
Series volume
v. 5265
Two- and three-dimensional vision systems for inspection, control, and metrology : 29-30 October 2003, Providence, Rhode Island, USA, Bruce G. Batchelor, Heinz Hügli, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering
Label
Two- and three-dimensional vision systems for inspection, control, and metrology : 29-30 October 2003, Providence, Rhode Island, USA, Bruce G. Batchelor, Heinz Hügli, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering
Publication
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Bibliography note
Includes bibliographical references and author index
http://library.link/vocab/cover_art
https://contentcafe2.btol.com/ContentCafe/Jacket.aspx?Return=1&Type=S&Value=9780819451538&userID=ebsco-test&password=ebsco-test
Dimensions
27 cm.
http://library.link/vocab/discovery_link
{'f': 'http://opac.lib.rpi.edu/record=b1604216'}
Extent
v, 214 p.
Isbn
9780819451538
Other physical details
ill.

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