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The Resource Thin film analysis by X-ray scattering, Mario Birkholz with contributions by Paul F. Fewster, Christoph Genzel

Thin film analysis by X-ray scattering, Mario Birkholz with contributions by Paul F. Fewster, Christoph Genzel

Label
Thin film analysis by X-ray scattering
Title
Thin film analysis by X-ray scattering
Statement of responsibility
Mario Birkholz with contributions by Paul F. Fewster, Christoph Genzel
Creator
Contributor
Subject
Language
eng
Cataloging source
UKM
Illustrations
illustrations
Index
index present
Literary form
non fiction
Nature of contents
bibliography
Thin film analysis by X-ray scattering, Mario Birkholz with contributions by Paul F. Fewster, Christoph Genzel
Label
Thin film analysis by X-ray scattering, Mario Birkholz with contributions by Paul F. Fewster, Christoph Genzel
Publication
Related Contributor
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Bibliography note
Includes bibliographical references and index
http://library.link/vocab/cover_art
https://contentcafe2.btol.com/ContentCafe/Jacket.aspx?Return=1&Type=S&Value=9783527310524&userID=ebsco-test&password=ebsco-test
Dimensions
25 cm.
http://library.link/vocab/discovery_link
{'f': 'http://opac.lib.rpi.edu/record=b2028409'}
Extent
xxii, 356 p.
Isbn
9783527310524
Other physical details
ill.

Library Locations

    • Folsom LibraryBorrow it
      110 8th St, Troy, NY, 12180, US
      42.729766 -73.682577
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