Coverart for item
The Resource Testing, reliability, and application of micro- and nano-material systems : 3-5 March, 2003, San Diego, California, Norbert Meyendorf, George Y. Baaklini, Bernd Michel, chairs/editors ; cosponsored by, National Institute of Standards and Technology (USA) ... [et al.] ; cooperating organizations, Institute of Acostic Microscopy (USA) ... [et al.] ; published by SPIE--the International Society for Optical Engineering

Testing, reliability, and application of micro- and nano-material systems : 3-5 March, 2003, San Diego, California, Norbert Meyendorf, George Y. Baaklini, Bernd Michel, chairs/editors ; cosponsored by, National Institute of Standards and Technology (USA) ... [et al.] ; cooperating organizations, Institute of Acostic Microscopy (USA) ... [et al.] ; published by SPIE--the International Society for Optical Engineering

Label
Testing, reliability, and application of micro- and nano-material systems : 3-5 March, 2003, San Diego, California
Title
Testing, reliability, and application of micro- and nano-material systems
Title remainder
3-5 March, 2003, San Diego, California
Statement of responsibility
Norbert Meyendorf, George Y. Baaklini, Bernd Michel, chairs/editors ; cosponsored by, National Institute of Standards and Technology (USA) ... [et al.] ; cooperating organizations, Institute of Acostic Microscopy (USA) ... [et al.] ; published by SPIE--the International Society for Optical Engineering
Contributor
Subject
Genre
Language
eng
Member of
Cataloging source
LHL
Illustrations
illustrations
Index
index present
Literary form
non fiction
Nature of contents
bibliography
Series statement
SPIE proceedings series
Series volume
v. 5045
Testing, reliability, and application of micro- and nano-material systems : 3-5 March, 2003, San Diego, California, Norbert Meyendorf, George Y. Baaklini, Bernd Michel, chairs/editors ; cosponsored by, National Institute of Standards and Technology (USA) ... [et al.] ; cooperating organizations, Institute of Acostic Microscopy (USA) ... [et al.] ; published by SPIE--the International Society for Optical Engineering
Label
Testing, reliability, and application of micro- and nano-material systems : 3-5 March, 2003, San Diego, California, Norbert Meyendorf, George Y. Baaklini, Bernd Michel, chairs/editors ; cosponsored by, National Institute of Standards and Technology (USA) ... [et al.] ; cooperating organizations, Institute of Acostic Microscopy (USA) ... [et al.] ; published by SPIE--the International Society for Optical Engineering
Publication
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Bibliography note
Includes bibliographical references and author index
http://library.link/vocab/cover_art
https://contentcafe2.btol.com/ContentCafe/Jacket.aspx?Return=1&Type=S&Value=9780819448507&userID=ebsco-test&password=ebsco-test
Dimensions
28 cm.
http://library.link/vocab/discovery_link
{'f': 'http://opac.lib.rpi.edu/record=b1500852'}
Extent
ix, 276 p.
Isbn
9780819448507
Other physical details
ill.

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