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The Resource Test and diagnosis of analogue, mixed-signal and RF integrated circuits : the system on chip approach, edited by Yichuang Sun

Test and diagnosis of analogue, mixed-signal and RF integrated circuits : the system on chip approach, edited by Yichuang Sun

Contributor
Summary
Annotation
Language
eng
Work
Publication
Extent
1 online resource (xx, 389 pages)
Note
Title from title screen
Contents
  • Fault diagnosis of linear and non-linear analogue circuits / Yichuang Sun
  • Symbolic function approaches for analogue fault diagnosis / Stefano Manetti and Maria Cristina Piccirilli
  • Neural-network-based approaches for analogue circuit fault diagnosis / Yichuang Sun and Yigang He
  • Hierarchical/decomposition techniques for large-scale analogue diagnosis / Peter Shepherd
  • DFT and BIST techniques for analogue and mixed-signal test / Mona Safi-Harb and Gordon Roberts
  • Design-for-testability of analogue filters / Yichuang Sun and Masood-ul Hasan
  • Test of A/D converters: from converter characteristics to built-in self-test proposals / Andreas Lechner and Andrew Richardson
  • Test of [Sigma Delta] converters / Gildas Leger and Adoracion Rueda
  • Phase-locked loop test methodologies: current characterization and production test practices / Martin John Burbidge and Andrew Richardson
  • On-chip testing techniques for RF wirless transceiver systems and components / Alberto Valdes-Garcia, Jose Silva-Martinez, Edgar Sanchez-Sinencio
  • Tuning and calibration of analogue, mixed-signal and RF circuits / James Moritz and Yichuang Sun
Isbn
9781615833153
Link
http://libproxy.rpi.edu/login?url=http://app.knovel.com/hotlink/toc/id:kpTDAMSRF1/test-and-diagnosis
Instance
Label
Test and diagnosis of analogue, mixed-signal and RF integrated circuits : the system on chip approach
Title
Test and diagnosis of analogue, mixed-signal and RF integrated circuits
Title remainder
the system on chip approach
Statement of responsibility
edited by Yichuang Sun
Contributor
Editor
Subject
Language
eng
Summary
Annotation
Member of
Cataloging source
CtWfDGI
Illustrations
illustrations
Index
index present
Literary form
non fiction
Nature of contents
  • dictionaries
  • bibliography
Series statement
Circuits, devices and systems series
Series volume
19
Summary expansion
This book provides a comprehensive discussion of automatic testing, diagnosis and tuning of analogue, mixed-signal and RF integrated circuits, and systems in a single source. It contains eleven chapters by leading researchers worldwide. As well as fundamental concepts and techniques, the book reports systematically the state of the arts and future research directions of these areas. A complete range of circuit components are covered and test issues from the SoC perspective. An essential reference for researchers and engineers in mixed signal testing, postgraduate and senior undergraduate students
Test and diagnosis of analogue, mixed-signal and RF integrated circuits : the system on chip approach, edited by Yichuang Sun
Label
Test and diagnosis of analogue, mixed-signal and RF integrated circuits : the system on chip approach, edited by Yichuang Sun
Link
http://libproxy.rpi.edu/login?url=http://app.knovel.com/hotlink/toc/id:kpTDAMSRF1/test-and-diagnosis
Publication
Note
Title from title screen
Related Contributor
Related Location
Related Agents
Related Authorities
Related Subjects
Related Items
Antecedent source
unknown
Bibliography note
Includes bibliographical references and index
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Color
multicolored
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Contents
Fault diagnosis of linear and non-linear analogue circuits / Yichuang Sun -- Symbolic function approaches for analogue fault diagnosis / Stefano Manetti and Maria Cristina Piccirilli -- Neural-network-based approaches for analogue circuit fault diagnosis / Yichuang Sun and Yigang He -- Hierarchical/decomposition techniques for large-scale analogue diagnosis / Peter Shepherd -- DFT and BIST techniques for analogue and mixed-signal test / Mona Safi-Harb and Gordon Roberts -- Design-for-testability of analogue filters / Yichuang Sun and Masood-ul Hasan -- Test of A/D converters: from converter characteristics to built-in self-test proposals / Andreas Lechner and Andrew Richardson -- Test of [Sigma Delta] converters / Gildas Leger and Adoracion Rueda -- Phase-locked loop test methodologies: current characterization and production test practices / Martin John Burbidge and Andrew Richardson -- On-chip testing techniques for RF wirless transceiver systems and components / Alberto Valdes-Garcia, Jose Silva-Martinez, Edgar Sanchez-Sinencio -- Tuning and calibration of analogue, mixed-signal and RF circuits / James Moritz and Yichuang Sun
http://library.link/vocab/cover_art
https://contentcafe2.btol.com/ContentCafe/Jacket.aspx?Return=1&Type=S&Value=9781615833153&userID=ebsco-test&password=ebsco-test
Dimensions
unknown
http://library.link/vocab/discovery_link
{'f': 'http://opac.lib.rpi.edu/record=b3763492'}
Extent
1 online resource (xx, 389 pages)
File format
unknown
Form of item
online
Isbn
9781615833153
Level of compression
unknown
Media category
computer
Media MARC source
rdamedia
Media type code
c
Other physical details
illustrations.
Quality assurance targets
not applicable
Reformatting quality
unknown
Sound
unknown sound
Specific material designation
remote

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