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The Resource Techniques for measuring the integrity of passivation overcoats on integrated circuits, Werner Kern and Robert B. Comizzoli
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Techniques for measuring the integrity of passivation overcoats on integrated circuits
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Techniques for measuring the integrity of passivation overcoats on integrated circuits
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Werner Kern and Robert B. Comizzoli
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  • Semiconductor measurement technology
  • National Bureau of Standards special publication ; 400-31
Techniques for measuring the integrity of passivation overcoats on integrated circuits, Werner Kern and Robert B. Comizzoli

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      42.729766 -73.682577
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