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The Resource Symposium on X-Ray and Electron Probe Analysis; : (papers) presented at the sixty-sixth annual meeting, American Society for Testing and Materials, Atlantic City, N.J., June 27, 1963

Symposium on X-Ray and Electron Probe Analysis; : (papers) presented at the sixty-sixth annual meeting, American Society for Testing and Materials, Atlantic City, N.J., June 27, 1963

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Symposium on X-Ray and Electron Probe Analysis; : (papers) presented at the sixty-sixth annual meeting, American Society for Testing and Materials, Atlantic City, N.J., June 27, 1963
Title
Symposium on X-Ray and Electron Probe Analysis;
Title remainder
(papers) presented at the sixty-sixth annual meeting, American Society for Testing and Materials, Atlantic City, N.J., June 27, 1963
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Symposium on X-Ray and Electron Probe Analysis; : (papers) presented at the sixty-sixth annual meeting, American Society for Testing and Materials, Atlantic City, N.J., June 27, 1963
Label
Symposium on X-Ray and Electron Probe Analysis; : (papers) presented at the sixty-sixth annual meeting, American Society for Testing and Materials, Atlantic City, N.J., June 27, 1963
Publication
Note
Sponsored jointly by ASTM Committees E-2 on Emission Spectroscopy and E-4 on Electron Metallography
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Bibliography note
Includes bibliographies
Dimensions
24 cm.
http://library.link/vocab/discovery_link
{'f': 'http://opac.lib.rpi.edu/record=b1033340'}
Extent
vi, 209 p.
Lccn
63-21661
Other physical details
illus.

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