Coverart for item
The Resource Surface scattering and diffraction for advanced metrology II : 9 July, 2002, Seattle, Washington, USA, Zu-Han Gu, Alexei A. Maradudin, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organizations, the Boeing Company ... [et al.]

Surface scattering and diffraction for advanced metrology II : 9 July, 2002, Seattle, Washington, USA, Zu-Han Gu, Alexei A. Maradudin, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organizations, the Boeing Company ... [et al.]

Label
Surface scattering and diffraction for advanced metrology II : 9 July, 2002, Seattle, Washington, USA
Title
Surface scattering and diffraction for advanced metrology II
Title remainder
9 July, 2002, Seattle, Washington, USA
Statement of responsibility
Zu-Han Gu, Alexei A. Maradudin, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organizations, the Boeing Company ... [et al.]
Contributor
Subject
Genre
Language
eng
Member of
Cataloging source
LHL
Illustrations
illustrations
Index
index present
Literary form
non fiction
Nature of contents
bibliography
Series statement
SPIE proceedings series
Series volume
v. 4780
Surface scattering and diffraction for advanced metrology II : 9 July, 2002, Seattle, Washington, USA, Zu-Han Gu, Alexei A. Maradudin, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organizations, the Boeing Company ... [et al.]
Label
Surface scattering and diffraction for advanced metrology II : 9 July, 2002, Seattle, Washington, USA, Zu-Han Gu, Alexei A. Maradudin, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organizations, the Boeing Company ... [et al.]
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Bibliography note
Includes bibliographic references and author index
http://library.link/vocab/cover_art
https://contentcafe2.btol.com/ContentCafe/Jacket.aspx?Return=1&Type=S&Value=9780819445476&userID=ebsco-test&password=ebsco-test
Dimensions
28 cm.
http://library.link/vocab/discovery_link
{'f': 'http://opac.lib.rpi.edu/record=b1480589'}
Extent
vii, 186 p.
Isbn
9780819445476
Lccn
2003535276
Other physical details
ill.

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