Coverart for item
The Resource Soft X-ray and EUV imaging systems : 3-4 August 2000, San Diego, USA, Winfried M. Kaiser, Richard H. Stulen, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering

Soft X-ray and EUV imaging systems : 3-4 August 2000, San Diego, USA, Winfried M. Kaiser, Richard H. Stulen, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering

Label
Soft X-ray and EUV imaging systems : 3-4 August 2000, San Diego, USA
Title
Soft X-ray and EUV imaging systems
Title remainder
3-4 August 2000, San Diego, USA
Statement of responsibility
Winfried M. Kaiser, Richard H. Stulen, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering
Contributor
Subject
Genre
Language
eng
Member of
Cataloging source
CUS
Index
index present
Literary form
non fiction
Series statement
SPIE proceedings series
Series volume
v. 4146
Soft X-ray and EUV imaging systems : 3-4 August 2000, San Diego, USA, Winfried M. Kaiser, Richard H. Stulen, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering
Label
Soft X-ray and EUV imaging systems : 3-4 August 2000, San Diego, USA, Winfried M. Kaiser, Richard H. Stulen, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering
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Bibliography note
Includes bibliographical references and index
http://library.link/vocab/cover_art
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Dimensions
28 cm.
http://library.link/vocab/discovery_link
{'f': 'http://opac.lib.rpi.edu/record=b1389239'}
Extent
vii, 178 p.
Isbn
9780819437914
Other physical details
ill.

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