Coverart for item
The Resource Sixth International Conference on Quality Control by Artificial Vision : 19-22 May 2003, Gatlinberg, Tennessee, USA, Kenneth W. Tobin, Jr., Fabrice Meriaudeau, chairs/editors ; sponsored by UT-Battelle ... [et al.] in cooperation with IEEE Signal Processing Society, SPIE--the International Society for Optical Engineering, [and] Machine Vision Association of SME--Society of Manufacturing Engineers (USA)

Sixth International Conference on Quality Control by Artificial Vision : 19-22 May 2003, Gatlinberg, Tennessee, USA, Kenneth W. Tobin, Jr., Fabrice Meriaudeau, chairs/editors ; sponsored by UT-Battelle ... [et al.] in cooperation with IEEE Signal Processing Society, SPIE--the International Society for Optical Engineering, [and] Machine Vision Association of SME--Society of Manufacturing Engineers (USA)

Label
Sixth International Conference on Quality Control by Artificial Vision : 19-22 May 2003, Gatlinberg, Tennessee, USA
Title
Sixth International Conference on Quality Control by Artificial Vision
Title remainder
19-22 May 2003, Gatlinberg, Tennessee, USA
Statement of responsibility
Kenneth W. Tobin, Jr., Fabrice Meriaudeau, chairs/editors ; sponsored by UT-Battelle ... [et al.] in cooperation with IEEE Signal Processing Society, SPIE--the International Society for Optical Engineering, [and] Machine Vision Association of SME--Society of Manufacturing Engineers (USA)
Title variation
  • 6th International Conference on Quality Control by Artificial Vision
  • International Conference on Quality Control by Artificial Vision
  • Quality control by artificial vision
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Contributor
Subject
Genre
Language
eng
Member of
Cataloging source
CUS
Index
index present
Literary form
non fiction
Series statement
SPIE,
Series volume
v. 5132
Sixth International Conference on Quality Control by Artificial Vision : 19-22 May 2003, Gatlinberg, Tennessee, USA, Kenneth W. Tobin, Jr., Fabrice Meriaudeau, chairs/editors ; sponsored by UT-Battelle ... [et al.] in cooperation with IEEE Signal Processing Society, SPIE--the International Society for Optical Engineering, [and] Machine Vision Association of SME--Society of Manufacturing Engineers (USA)
Label
Sixth International Conference on Quality Control by Artificial Vision : 19-22 May 2003, Gatlinberg, Tennessee, USA, Kenneth W. Tobin, Jr., Fabrice Meriaudeau, chairs/editors ; sponsored by UT-Battelle ... [et al.] in cooperation with IEEE Signal Processing Society, SPIE--the International Society for Optical Engineering, [and] Machine Vision Association of SME--Society of Manufacturing Engineers (USA)
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Bibliography note
Includes bibliographical references and author index
http://library.link/vocab/cover_art
https://contentcafe2.btol.com/ContentCafe/Jacket.aspx?Return=1&Type=S&Value=9780819449986&userID=ebsco-test&password=ebsco-test
Dimensions
28 cm.
http://library.link/vocab/discovery_link
{'f': 'http://opac.lib.rpi.edu/record=b1499170'}
Extent
xii, 594 p.
Isbn
9780819449986
Other physical details
ill.

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