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The Resource Secondary ion mass spectrometry : SIMS IV : proceedings of the fourth international conference, Osaka, Japan, November 13-19, 1983, editors: A. Benninghoven ... (et al.)

Secondary ion mass spectrometry : SIMS IV : proceedings of the fourth international conference, Osaka, Japan, November 13-19, 1983, editors: A. Benninghoven ... (et al.)

Label
Secondary ion mass spectrometry : SIMS IV : proceedings of the fourth international conference, Osaka, Japan, November 13-19, 1983
Title
Secondary ion mass spectrometry
Title remainder
SIMS IV : proceedings of the fourth international conference, Osaka, Japan, November 13-19, 1983
Statement of responsibility
editors: A. Benninghoven ... (et al.)
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Subject
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Member of
Series statement
Springer series in chemical physics
Series volume
v. 36
Secondary ion mass spectrometry : SIMS IV : proceedings of the fourth international conference, Osaka, Japan, November 13-19, 1983, editors: A. Benninghoven ... (et al.)
Label
Secondary ion mass spectrometry : SIMS IV : proceedings of the fourth international conference, Osaka, Japan, November 13-19, 1983, editors: A. Benninghoven ... (et al.)
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Bibliography note
Includes bibliographies and index
http://library.link/vocab/cover_art
https://contentcafe2.btol.com/ContentCafe/Jacket.aspx?Return=1&Type=S&Value=9783540133162&userID=ebsco-test&password=ebsco-test
Dimensions
24 cm.
http://library.link/vocab/discovery_link
{'f': 'http://opac.lib.rpi.edu/record=b1157493'}
Extent
xv, 503 p.
Isbn
9783540133162
Isbn Type
(W.Ger.)
Lccn
84-5330
Other physical details
ill.

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