Coverart for item
The Resource Scientific detection of fakery in art : 29-30 January 1998, San Jose, California, Walter McCrone, Duane R. Chartier, Richard J Weiss, chairs/editors ; sponsored by IS&T--the Society for Imaging Science and Technology [and] SPIE--the International Society for Optical Engineering

Scientific detection of fakery in art : 29-30 January 1998, San Jose, California, Walter McCrone, Duane R. Chartier, Richard J Weiss, chairs/editors ; sponsored by IS&T--the Society for Imaging Science and Technology [and] SPIE--the International Society for Optical Engineering

Label
Scientific detection of fakery in art : 29-30 January 1998, San Jose, California
Title
Scientific detection of fakery in art
Title remainder
29-30 January 1998, San Jose, California
Statement of responsibility
Walter McCrone, Duane R. Chartier, Richard J Weiss, chairs/editors ; sponsored by IS&T--the Society for Imaging Science and Technology [and] SPIE--the International Society for Optical Engineering
Contributor
Subject
Genre
Language
eng
Member of
Cataloging source
CUS
Index
index present
Literary form
non fiction
Series statement
SPIE proceedings series
Series volume
v. 3315
Scientific detection of fakery in art : 29-30 January 1998, San Jose, California, Walter McCrone, Duane R. Chartier, Richard J Weiss, chairs/editors ; sponsored by IS&T--the Society for Imaging Science and Technology [and] SPIE--the International Society for Optical Engineering
Label
Scientific detection of fakery in art : 29-30 January 1998, San Jose, California, Walter McCrone, Duane R. Chartier, Richard J Weiss, chairs/editors ; sponsored by IS&T--the Society for Imaging Science and Technology [and] SPIE--the International Society for Optical Engineering
Publication
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Bibliography note
Includes bibliographical references and index
http://library.link/vocab/cover_art
https://contentcafe2.btol.com/ContentCafe/Jacket.aspx?Return=1&Type=S&Value=9780819427557&userID=ebsco-test&password=ebsco-test
Dimensions
28 cm.
http://library.link/vocab/discovery_link
{'f': 'http://opac.lib.rpi.edu/record=b1350341'}
Extent
v, 106 p.
Isbn
9780819427557
Other physical details
ill.

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