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The Resource Scanning probe microscopies II : 18-19 January 1993, Los Angeles, California, Clayton C. Williams, chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering

Scanning probe microscopies II : 18-19 January 1993, Los Angeles, California, Clayton C. Williams, chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering

Label
Scanning probe microscopies II : 18-19 January 1993, Los Angeles, California
Title
Scanning probe microscopies II
Title remainder
18-19 January 1993, Los Angeles, California
Statement of responsibility
Clayton C. Williams, chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering
Title variation
Scanning probe microscopies 2
Contributor
Subject
Genre
Member of
Series statement
SPIE proceedings series
Series volume
v. 1855
Scanning probe microscopies II : 18-19 January 1993, Los Angeles, California, Clayton C. Williams, chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering
Label
Scanning probe microscopies II : 18-19 January 1993, Los Angeles, California, Clayton C. Williams, chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering
Publication
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Bibliography note
Includes bibliographical references and index
http://library.link/vocab/cover_art
https://contentcafe2.btol.com/ContentCafe/Jacket.aspx?Return=1&Type=S&Value=9780819410818&userID=ebsco-test&password=ebsco-test
Dimensions
28 cm.
http://library.link/vocab/discovery_link
{'f': 'http://opac.lib.rpi.edu/record=b1254048'}
Extent
ix, 220 p.
Isbn
9780819410818
Lccn
93-83323
Other physical details
ill.

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