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The Resource Scanning hot probe technique for nanostructured films thermoelectric properties characterization, by Claudiu Liviu Hapenciuc
Label
Scanning hot probe technique for nanostructured films thermoelectric properties characterization
Title
Scanning hot probe technique for nanostructured films thermoelectric properties characterization
Statement of responsibility
by Claudiu Liviu Hapenciuc
Creator
Contributor
Thesis advisor
Subject
Genre
Language
eng
Additional physical form
Also available on the World Wide Web.
Cataloging source
YRM
Dissertation note
Thesis (Ph.D.)--Rensselaer Polytechnic Institute, December 2007.
Illustrations
illustrations
Index
no index present
Literary form
non fiction
Nature of contents
  • bibliography
  • theses
Scanning hot probe technique for nanostructured films thermoelectric properties characterization, by Claudiu Liviu Hapenciuc
Label
Scanning hot probe technique for nanostructured films thermoelectric properties characterization, by Claudiu Liviu Hapenciuc
Link
http://digitool.rpi.edu:1801/webclient/DeliveryManager?application=DIGITOOL-3&owner=resourcediscovery&custom_att_2=simple_viewer&pid=9674
Publication
Note
UMI no. 3302607
Related Contributor
Related Authorities
Related Subjects
Bibliography note
Includes bibliographical references
http://library.link/vocab/cover_art
https://contentcafe2.btol.com/ContentCafe/Jacket.aspx?Return=1&Type=S&Value=9780549483625&userID=ebsco-test&password=ebsco-test
Dimensions
29 cm.
http://library.link/vocab/discovery_link
{'f': 'http://opac.lib.rpi.edu/record=b2399491'}
Extent
xiii, 69 leaves, bound
Governing access note
Restricted to current Rensselaer faculty, staff and students. Access inquiries may be directed to the Rensselaer Libraries
Isbn
9780549483625
Other physical details
ill.
Terms governing use
This electronic version is a licensed copy owned by Rensselaer Polytechnic Institute, Troy, NY. Copyright of original work retained by author.

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