Coverart for item
The Resource SAR image analysis, modeling, and techniques III : 25-27 September 2000, Barcelona, Spain, Francesco Posa, Luciano Guerriero, chairs/editors ; sponsored by EOS--the European Optical Society, SPIE--the International Society for Optical Engineering, [and] NASA--National Aeronautics and Space Administration (USA)

SAR image analysis, modeling, and techniques III : 25-27 September 2000, Barcelona, Spain, Francesco Posa, Luciano Guerriero, chairs/editors ; sponsored by EOS--the European Optical Society, SPIE--the International Society for Optical Engineering, [and] NASA--National Aeronautics and Space Administration (USA)

Label
SAR image analysis, modeling, and techniques III : 25-27 September 2000, Barcelona, Spain
Title
SAR image analysis, modeling, and techniques III
Title remainder
25-27 September 2000, Barcelona, Spain
Statement of responsibility
Francesco Posa, Luciano Guerriero, chairs/editors ; sponsored by EOS--the European Optical Society, SPIE--the International Society for Optical Engineering, [and] NASA--National Aeronautics and Space Administration (USA)
Title variation
  • SAR image analysis, modeling, and techniques 3
  • Synthetic aperture radar image analysis, modeling, and techniques III
Contributor
Subject
Genre
Language
eng
Member of
Cataloging source
CUS
Index
index present
Literary form
non fiction
Series statement
SPIE proceedings series
Series volume
v. 4173
SAR image analysis, modeling, and techniques III : 25-27 September 2000, Barcelona, Spain, Francesco Posa, Luciano Guerriero, chairs/editors ; sponsored by EOS--the European Optical Society, SPIE--the International Society for Optical Engineering, [and] NASA--National Aeronautics and Space Administration (USA)
Label
SAR image analysis, modeling, and techniques III : 25-27 September 2000, Barcelona, Spain, Francesco Posa, Luciano Guerriero, chairs/editors ; sponsored by EOS--the European Optical Society, SPIE--the International Society for Optical Engineering, [and] NASA--National Aeronautics and Space Administration (USA)
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Bibliography note
Includes bibliographical references and author index
http://library.link/vocab/cover_art
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Dimensions
28 cm.
http://library.link/vocab/discovery_link
{'f': 'http://opac.lib.rpi.edu/record=b1397505'}
Extent
vii, 312 p.
Isbn
9780819438294
Other physical details
ill.

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