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The Resource Run-to-run control in semiconductor manufacturing, edited by James Moyne, Enrique Del Castillo, Arnon Max Hurwitz

Run-to-run control in semiconductor manufacturing, edited by James Moyne, Enrique Del Castillo, Arnon Max Hurwitz

Label
Run-to-run control in semiconductor manufacturing
Title
Run-to-run control in semiconductor manufacturing
Statement of responsibility
edited by James Moyne, Enrique Del Castillo, Arnon Max Hurwitz
Contributor
Subject
Language
eng
Cataloging source
DLC
Illustrations
illustrations
Index
index present
LC call number
TK7871.85
LC item number
.R86 2001
Literary form
non fiction
Nature of contents
bibliography
Run-to-run control in semiconductor manufacturing, edited by James Moyne, Enrique Del Castillo, Arnon Max Hurwitz
Label
Run-to-run control in semiconductor manufacturing, edited by James Moyne, Enrique Del Castillo, Arnon Max Hurwitz
Publication
Related Contributor
Related Location
Related Agents
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Bibliography note
Includes bibliographical references and index
http://library.link/vocab/cover_art
https://contentcafe2.btol.com/ContentCafe/Jacket.aspx?Return=1&Type=S&Value=9780849311789&userID=ebsco-test&password=ebsco-test
Dimensions
25 cm.
http://library.link/vocab/discovery_link
{'f': 'http://opac.lib.rpi.edu/record=b1385672'}
Extent
348 p.
Isbn
9780849311789
Isbn Type
(alk. paper)
Lccn
00059910
Other physical details
ill.

Library Locations

    • Folsom LibraryBorrow it
      110 8th St, Troy, NY, 12180, US
      42.729766 -73.682577
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