Coverart for item
The Resource Robust speckle metrology techniques for stress analysis and NDT, Matias R. Viotti and Armando Albertazzi, Jr

Robust speckle metrology techniques for stress analysis and NDT, Matias R. Viotti and Armando Albertazzi, Jr

Label
Robust speckle metrology techniques for stress analysis and NDT
Title
Robust speckle metrology techniques for stress analysis and NDT
Statement of responsibility
Matias R. Viotti and Armando Albertazzi, Jr
Creator
Contributor
Author
Publisher
Subject
Language
eng
Summary
Optical techniques are usually applied inside laboratories equipped with temperature, humidity and vibration control. These techniques are very suitable for fast measurements due to their noncontact nature and their capability to measure on surfaces without special, time-consuming preparation. Among them, optical methods based on the speckle phenomenon have developed substantially over the last two decades due to the development of digital image processing, digital cameras, computers, lasers, and optical components. However, applying speckle methods outside of the laboratory becomes a challenging task. This book presents techniques and tools that will enable the development of robust measurement instruments to be used outside the laboratory for nondestructive structural-integrity-evaluation devices. Additionally, several technical solutions that combine mechanical systems to solve industrial measurement demands are described
Member of
Additional physical form
Also available in print version.
Cataloging source
CaBNVSL
Illustrations
illustrations
Index
no index present
Literary form
non fiction
Nature of contents
  • dictionaries
  • bibliography
Series statement
SPIE Press monograph
Series volume
PM251
Target audience
adult
Robust speckle metrology techniques for stress analysis and NDT, Matias R. Viotti and Armando Albertazzi, Jr
Label
Robust speckle metrology techniques for stress analysis and NDT, Matias R. Viotti and Armando Albertazzi, Jr
Link
http://libproxy.rpi.edu/login?url=http://dx.doi.org/10.1117/3.1002651
Publication
Note
"SPIE Digital Library."--Website
Related Contributor
Related Location
Related Agents
Related Authorities
Related Subjects
Related Items
Bibliography note
Includes bibliographical references
Carrier category
online resource
Carrier MARC source
rdacarrier
Color
black and white
Content category
text
Content type MARC source
rdacontent
Contents
Preface -- List of symbols and notation -- 1. NDT applications in engineering -- 2. Principles of digital speckle pattern interferometry -- 3. Optical configurations for measurements using DSPI -- 4. Robust optical systems -- 5. Quantitative evaluation of stresses and strains -- 6. Quantitative evaluation of residual stresses -- 7. Qualitative fault detection and evaluation -- 8. Digital image correlation for structural monitoring -- 9. Closing remarks
http://library.link/vocab/cover_art
https://contentcafe2.btol.com/ContentCafe/Jacket.aspx?Return=1&Type=S&Value=9781628413199&userID=ebsco-test&password=ebsco-test
Dimensions
unknown
http://library.link/vocab/discovery_link
{'f': 'http://opac.lib.rpi.edu/record=b3828804'}
Extent
1 online resource (xiii, 176 pages)
File format
multiple file formats
Form of item
online
Governing access note
Restricted to subscribers or individual electronic text purchasers
Isbn
9781628413199
Media category
electronic
Media MARC source
isbdmedia
Other physical details
illustrations.
Reformatting quality
access
Specific material designation
remote
System details
  • Mode of access: World Wide Web
  • System requirements: Adobe Acrobat Reader

Library Locations

    • Folsom LibraryBorrow it
      110 8th St, Troy, NY, 12180, US
      42.729766 -73.682577
Processing Feedback ...