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The Resource Reliability and radiation effects in compound semiconductors, Allan Johnston

Reliability and radiation effects in compound semiconductors, Allan Johnston

Label
Reliability and radiation effects in compound semiconductors
Title
Reliability and radiation effects in compound semiconductors
Statement of responsibility
Allan Johnston
Creator
Subject
Language
eng
Summary
This book focuses on reliability and radiation effects in compound semiconductors, which have evolved rapidly during the last 15 years. It starts with first principles, and shows how advances in device design and manufacturing have suppressed many of the older reliability mechanisms. It is the first book that comprehensively covers reliability and radiation effects in optoelectronic as well as microelectronic devices. It contrasts reliability mechanisms of compound semiconductors with those of silicon-based devices, and shows that the reliability of many compound semiconductors has improved to the level where they can be used for ten years or more with low failure rates
Cataloging source
KNOVL
Illustrations
illustrations
Index
index present
Literary form
non fiction
Nature of contents
  • dictionaries
  • bibliography
Reliability and radiation effects in compound semiconductors, Allan Johnston
Label
Reliability and radiation effects in compound semiconductors, Allan Johnston
Link
http://libproxy.rpi.edu/login?url=http://app.knovel.com/hotlink/toc/id:kpRRECS002/reliability-and-radiation
Publication
Related Contributor
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Bibliography note
Includes bibliographical references (page 356) and index
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Color
multicolored
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Contents
Semiconductor fundamentals -- Transistor technologies -- Optoelectronics -- Reliability fundamentals -- Compound semiconductor reliability -- Optoelectronic device reliability -- Radiation environments -- Interactions of radiation with semiconductors -- Displacement damage in compound semiconductors -- Displacement damage in optoelectronic devices -- Radiation damage in optocouplers -- Effects from single particles
http://library.link/vocab/cover_art
https://contentcafe2.btol.com/ContentCafe/Jacket.aspx?Return=1&Type=S&Value=9781615836871&userID=ebsco-test&password=ebsco-test
Dimensions
unknown
http://library.link/vocab/discovery_link
{'f': 'http://opac.lib.rpi.edu/record=b3763697'}
Extent
1 online resource (xii, 363 pages)
Form of item
online
Isbn
9781615836871
Media category
computer
Media MARC source
rdamedia
Media type code
c
Other physical details
illustrations
Specific material designation
remote

Library Locations

    • Folsom LibraryBorrow it
      110 8th St, Troy, NY, 12180, US
      42.729766 -73.682577
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