Coverart for item
The Resource Polarization measurement, analysis, and applications V : 8-9 July 2002, Seattle, [Washington] USA, Dennis H. Goldstein, David B. Chenault, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organizations, the Boeing Company (USA) ... [et al.]

Polarization measurement, analysis, and applications V : 8-9 July 2002, Seattle, [Washington] USA, Dennis H. Goldstein, David B. Chenault, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organizations, the Boeing Company (USA) ... [et al.]

Label
Polarization measurement, analysis, and applications V : 8-9 July 2002, Seattle, [Washington] USA
Title
Polarization measurement, analysis, and applications V
Title remainder
8-9 July 2002, Seattle, [Washington] USA
Statement of responsibility
Dennis H. Goldstein, David B. Chenault, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organizations, the Boeing Company (USA) ... [et al.]
Contributor
Subject
Genre
Language
eng
Member of
Cataloging source
ZCU
Illustrations
illustrations
Index
index present
LC call number
QC440
LC item number
.P67 2002
Literary form
non fiction
Nature of contents
bibliography
Series statement
SPIE proceedings series,
Series volume
v. 4819
Polarization measurement, analysis, and applications V : 8-9 July 2002, Seattle, [Washington] USA, Dennis H. Goldstein, David B. Chenault, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organizations, the Boeing Company (USA) ... [et al.]
Label
Polarization measurement, analysis, and applications V : 8-9 July 2002, Seattle, [Washington] USA, Dennis H. Goldstein, David B. Chenault, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organizations, the Boeing Company (USA) ... [et al.]
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Bibliography note
Includes bibliographic references and author index
http://library.link/vocab/cover_art
https://contentcafe2.btol.com/ContentCafe/Jacket.aspx?Return=1&Type=S&Value=9780819445872&userID=ebsco-test&password=ebsco-test
Dimensions
28 cm.
http://library.link/vocab/discovery_link
{'f': 'http://opac.lib.rpi.edu/record=b1480296'}
Extent
vii, 206 p.
Isbn
9780819445872
Lccn
2003265066
Other physical details
ill.

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