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The Resource Physical measurement and analysis of thin films,, edited by E. M. Murt and W. G. Guldner

Physical measurement and analysis of thin films,, edited by E. M. Murt and W. G. Guldner

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Physical measurement and analysis of thin films,
Title
Physical measurement and analysis of thin films,
Statement of responsibility
edited by E. M. Murt and W. G. Guldner
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Series statement
Progress in analytical chemistry v. 2
Physical measurement and analysis of thin films,, edited by E. M. Murt and W. G. Guldner
Label
Physical measurement and analysis of thin films,, edited by E. M. Murt and W. G. Guldner
Publication
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Bibliography note
Includes bibliographies
Dimensions
24 cm.
http://library.link/vocab/discovery_link
{'f': 'http://opac.lib.rpi.edu/record=b1045863'}
Extent
xi, 194 p.
Lccn
68-31239
Other physical details
illus.

Library Locations

    • Folsom LibraryBorrow it
      110 8th St, Troy, NY, 12180, US
      42.729766 -73.682577
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