Coverart for item
The Resource Photon processing in microelectronics and photonics : 21-24 January 2002, San Jose, USA, Koji Sugioka ... [et al.], chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering ; cosponsored by Air Force Office of Scientific Research (USA)

Photon processing in microelectronics and photonics : 21-24 January 2002, San Jose, USA, Koji Sugioka ... [et al.], chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering ; cosponsored by Air Force Office of Scientific Research (USA)

Label
Photon processing in microelectronics and photonics : 21-24 January 2002, San Jose, USA
Title
Photon processing in microelectronics and photonics
Title remainder
21-24 January 2002, San Jose, USA
Statement of responsibility
Koji Sugioka ... [et al.], chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering ; cosponsored by Air Force Office of Scientific Research (USA)
Contributor
Subject
Genre
Language
eng
Member of
Cataloging source
TEF
Illustrations
illustrations
Index
index present
LC call number
TA1505
LC item number
.P54 2002
Literary form
non fiction
Nature of contents
bibliography
Series statement
Proceedings of SPIE,
Series volume
v. 4637
Photon processing in microelectronics and photonics : 21-24 January 2002, San Jose, USA, Koji Sugioka ... [et al.], chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering ; cosponsored by Air Force Office of Scientific Research (USA)
Label
Photon processing in microelectronics and photonics : 21-24 January 2002, San Jose, USA, Koji Sugioka ... [et al.], chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering ; cosponsored by Air Force Office of Scientific Research (USA)
Publication
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Bibliography note
Includes bibliographical references and author index
http://library.link/vocab/cover_art
https://contentcafe2.btol.com/ContentCafe/Jacket.aspx?Return=1&Type=S&Value=9780819443762&userID=ebsco-test&password=ebsco-test
Dimensions
28 cm.
http://library.link/vocab/discovery_link
{'f': 'http://opac.lib.rpi.edu/record=b1449708'}
Extent
xvi, 597 p.
Isbn
9780819443762
Other physical details
ill.

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