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The Resource Optical microstructural characterization of semiconductors : symposium held November 29-30, 1999, Boston, Massachusetts, U.S.A., editors, M. Selim Ünlü ... [et al.]

Optical microstructural characterization of semiconductors : symposium held November 29-30, 1999, Boston, Massachusetts, U.S.A., editors, M. Selim Ünlü ... [et al.]

Label
Optical microstructural characterization of semiconductors : symposium held November 29-30, 1999, Boston, Massachusetts, U.S.A.
Title
Optical microstructural characterization of semiconductors
Title remainder
symposium held November 29-30, 1999, Boston, Massachusetts, U.S.A.
Statement of responsibility
editors, M. Selim Ünlü ... [et al.]
Contributor
Subject
Genre
Language
eng
Member of
Cataloging source
DLC
Illustrations
illustrations
Index
index present
LC call number
QC610.9
LC item number
.O67 2000
Literary form
non fiction
Nature of contents
bibliography
Series statement
Materials Research Society symposium proceedings,
Series volume
v. 588
Optical microstructural characterization of semiconductors : symposium held November 29-30, 1999, Boston, Massachusetts, U.S.A., editors, M. Selim Ünlü ... [et al.]
Label
Optical microstructural characterization of semiconductors : symposium held November 29-30, 1999, Boston, Massachusetts, U.S.A., editors, M. Selim Ünlü ... [et al.]
Publication
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Bibliography note
Includes bibliographical references and indexes
http://library.link/vocab/cover_art
https://contentcafe2.btol.com/ContentCafe/Jacket.aspx?Return=1&Type=S&Value=9781558994966&userID=ebsco-test&password=ebsco-test
Dimensions
24 cm.
http://library.link/vocab/discovery_link
{'f': 'http://opac.lib.rpi.edu/record=b1381887'}
Extent
xi, 333 p.
Isbn
9781558994966
Lccn
00028177
Other physical details
ill.

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