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The Resource Optical Properties of Bismuth-Based Topological Insulators, by Paola Di Pietro, (electronic resource)

Optical Properties of Bismuth-Based Topological Insulators, by Paola Di Pietro, (electronic resource)

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Optical Properties of Bismuth-Based Topological Insulators
Title
Optical Properties of Bismuth-Based Topological Insulators
Statement of responsibility
by Paola Di Pietro
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Author
Subject
Language
eng
Summary
Topological Insulators (TIs)  are insulators in the bulk, but have exotic metallic states at their surfaces. The topology, associated with the electronic wavefunctions of these systems, changes when passing from the bulk to the surface.This work studies, by means of infrared spectroscopy, the low energy optical conductivity of Bismuth based TIs in order to identify the extrinsic charge contribution of the bulk and to separate it from the intrinsic contribution of the surface state carriers. The extensive results presented in this thesis definitely shows the 2D character of the carriers in Bismuth-based topological insulators. The experimental apparatus and the FTIR technique, the theory of optical properties and Surface Plasmon Polaritons, as well as sample preparation of both crystals and thin films, and the analysis procedures are thoroughly described
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Literary form
non fiction
Series statement
Springer Theses, Recognizing Outstanding Ph.D. Research,
Optical Properties of Bismuth-Based Topological Insulators, by Paola Di Pietro, (electronic resource)
Label
Optical Properties of Bismuth-Based Topological Insulators, by Paola Di Pietro, (electronic resource)
Link
http://libproxy.rpi.edu/login?url=http://dx.doi.org/10.1007/978-3-319-01991-8
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Antecedent source
mixed
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Color
not applicable
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Contents
List of Abbreviations -- Supervisor's Foreword -- 1 Introduction to the Topological Insulators and State of the Art -- 2 Experimental Technique, Sample Fabrication and Models for Data Analysis -- 3 Results and Analysis
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https://contentcafe2.btol.com/ContentCafe/Jacket.aspx?Return=1&Type=S&Value=9783319019918&userID=ebsco-test&password=ebsco-test
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unknown
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{'f': 'http://opac.lib.rpi.edu/record=b3552118'}
Extent
X, 119 p. 78 illus., 36 illus. in color.
File format
multiple file formats
Form of item
electronic
Isbn
9783319019918
Level of compression
uncompressed
Media category
computer
Media MARC source
rdamedia
Media type code
c
Other physical details
online resource.
Quality assurance targets
absent
Reformatting quality
access
Specific material designation
remote

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