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The Resource Nondestructive characterization of semiconductor by microwave reflection
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Nondestructive characterization of semiconductor by microwave reflection
Title
Nondestructive characterization of semiconductor by microwave reflection
Creator
Contributor
Dissertation note
Thesis (master's)--Rensselaer Polytechnic Institute, May 1986.
Nondestructive characterization of semiconductor by microwave reflection
Label
Nondestructive characterization of semiconductor by microwave reflection
Publication
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http://library.link/vocab/discovery_link
{'f': 'http://opac.lib.rpi.edu/record=b1173886'}
Extent
98 p.

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