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The Resource Noise in semiconductor devices : modeling and simulation, Fabrizio Bonani, Giovanni Ghione

Noise in semiconductor devices : modeling and simulation, Fabrizio Bonani, Giovanni Ghione

Label
Noise in semiconductor devices : modeling and simulation
Title
Noise in semiconductor devices
Title remainder
modeling and simulation
Statement of responsibility
Fabrizio Bonani, Giovanni Ghione
Creator
Contributor
Subject
Language
eng
Member of
Cataloging source
DLC
Illustrations
illustrations
Index
index present
LC call number
TK7867.5
LC item number
.B65 2001
Literary form
non fiction
Nature of contents
bibliography
Series statement
Springer series in advanced microelectronics,
Series volume
7
Noise in semiconductor devices : modeling and simulation, Fabrizio Bonani, Giovanni Ghione
Label
Noise in semiconductor devices : modeling and simulation, Fabrizio Bonani, Giovanni Ghione
Publication
Related Contributor
Related Location
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Bibliography note
Includes bibliographical references (p. [201]-208) and index
http://library.link/vocab/cover_art
https://contentcafe2.btol.com/ContentCafe/Jacket.aspx?Return=1&Type=S&Value=9783540665830&userID=ebsco-test&password=ebsco-test
Dimensions
24 cm.
http://library.link/vocab/discovery_link
{'f': 'http://opac.lib.rpi.edu/record=b1401095'}
Extent
xxxi, 213 p.
Isbn
9783540665830
Isbn Type
(alk. paper)
Lccn
2001042017
Other physical details
ill.

Library Locations

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      110 8th St, Troy, NY, 12180, US
      42.729766 -73.682577
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