Coverart for item
The Resource Noise in devices and circuits : 2-4 June, 2003, Santa Fe, New Mexico, USA, M. Jamal Deen, Zeynep Çelik-Butler, Michael E. Levinshtein, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering, National Semiconductor Corporation ; published by SPIE--the International Society for Optical Engineering

Noise in devices and circuits : 2-4 June, 2003, Santa Fe, New Mexico, USA, M. Jamal Deen, Zeynep Çelik-Butler, Michael E. Levinshtein, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering, National Semiconductor Corporation ; published by SPIE--the International Society for Optical Engineering

Label
Noise in devices and circuits : 2-4 June, 2003, Santa Fe, New Mexico, USA
Title
Noise in devices and circuits
Title remainder
2-4 June, 2003, Santa Fe, New Mexico, USA
Statement of responsibility
M. Jamal Deen, Zeynep Çelik-Butler, Michael E. Levinshtein, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering, National Semiconductor Corporation ; published by SPIE--the International Society for Optical Engineering
Contributor
Subject
Genre
Language
eng
Member of
Cataloging source
LHL
Illustrations
illustrations
Index
index present
Literary form
non fiction
Nature of contents
bibliography
Series statement
Proceedings / SPIE--the International Society for Optical Engineering
Series volume
v. 5113
Noise in devices and circuits : 2-4 June, 2003, Santa Fe, New Mexico, USA, M. Jamal Deen, Zeynep Çelik-Butler, Michael E. Levinshtein, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering, National Semiconductor Corporation ; published by SPIE--the International Society for Optical Engineering
Label
Noise in devices and circuits : 2-4 June, 2003, Santa Fe, New Mexico, USA, M. Jamal Deen, Zeynep Çelik-Butler, Michael E. Levinshtein, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering, National Semiconductor Corporation ; published by SPIE--the International Society for Optical Engineering
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Bibliography note
Includes bibliographical references and author index
http://library.link/vocab/cover_art
https://contentcafe2.btol.com/ContentCafe/Jacket.aspx?Return=1&Type=S&Value=9780819449733&userID=ebsco-test&password=ebsco-test
Dimensions
28 cm.
http://library.link/vocab/discovery_link
{'f': 'http://opac.lib.rpi.edu/record=b1498804'}
Extent
xxi, 516 p.
Isbn
9780819449733
Other physical details
ill.

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