Coverart for item
The Resource Noise and information in nanoelectronics, sensors, and standards : 2-4 June 2003, Santa Fe, New Mexico, USA, Laszlo B. Kish ... [et al.], chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering [and] TAMU Telecommunications Task Force (USA)

Noise and information in nanoelectronics, sensors, and standards : 2-4 June 2003, Santa Fe, New Mexico, USA, Laszlo B. Kish ... [et al.], chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering [and] TAMU Telecommunications Task Force (USA)

Label
Noise and information in nanoelectronics, sensors, and standards : 2-4 June 2003, Santa Fe, New Mexico, USA
Title
Noise and information in nanoelectronics, sensors, and standards
Title remainder
2-4 June 2003, Santa Fe, New Mexico, USA
Statement of responsibility
Laszlo B. Kish ... [et al.], chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering [and] TAMU Telecommunications Task Force (USA)
Contributor
Subject
Genre
Language
eng
Member of
Cataloging source
CUS
Index
index present
Literary form
non fiction
Series statement
SPIE proceedings series,
Series volume
v. 5115
Noise and information in nanoelectronics, sensors, and standards : 2-4 June 2003, Santa Fe, New Mexico, USA, Laszlo B. Kish ... [et al.], chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering [and] TAMU Telecommunications Task Force (USA)
Label
Noise and information in nanoelectronics, sensors, and standards : 2-4 June 2003, Santa Fe, New Mexico, USA, Laszlo B. Kish ... [et al.], chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering [and] TAMU Telecommunications Task Force (USA)
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Bibliography note
Includes bibliographical references and author index
http://library.link/vocab/cover_art
https://contentcafe2.btol.com/ContentCafe/Jacket.aspx?Return=1&Type=S&Value=9780819449757&userID=ebsco-test&password=ebsco-test
Dimensions
28 cm.
http://library.link/vocab/discovery_link
{'f': 'http://opac.lib.rpi.edu/record=b1498795'}
Extent
xix, 430 p.
Isbn
9780819449757
Other physical details
ill.

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