Coverart for item
The Resource Nanostructure science, metrology, and technology : 5-7 September 2001, Gaithersburg, USA, Martin C. Peckerar, Michael T. Postek, Jr., chairs/editors

Nanostructure science, metrology, and technology : 5-7 September 2001, Gaithersburg, USA, Martin C. Peckerar, Michael T. Postek, Jr., chairs/editors

Label
Nanostructure science, metrology, and technology : 5-7 September 2001, Gaithersburg, USA
Title
Nanostructure science, metrology, and technology
Title remainder
5-7 September 2001, Gaithersburg, USA
Statement of responsibility
Martin C. Peckerar, Michael T. Postek, Jr., chairs/editors
Contributor
Subject
Genre
Language
eng
Member of
Cataloging source
TEF
Illustrations
illustrations
Index
index present
LC call number
T174.7
LC item number
.N365 2002
Literary form
non fiction
Nature of contents
bibliography
Series statement
SPIE proceedings series,
Series volume
v. 4608
Nanostructure science, metrology, and technology : 5-7 September 2001, Gaithersburg, USA, Martin C. Peckerar, Michael T. Postek, Jr., chairs/editors
Label
Nanostructure science, metrology, and technology : 5-7 September 2001, Gaithersburg, USA, Martin C. Peckerar, Michael T. Postek, Jr., chairs/editors
Publication
Note
"Sponsored by SPIE-the International Society for Optical Engineering, National Institute of Standards and Technology (USA), Office of Naval Research (USA)."
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Related Location
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Bibliography note
Includes bibliographical references and author index
http://library.link/vocab/cover_art
https://contentcafe2.btol.com/ContentCafe/Jacket.aspx?Return=1&Type=S&Value=9780819443472&userID=ebsco-test&password=ebsco-test
Dimensions
28 cm.
http://library.link/vocab/discovery_link
{'f': 'http://opac.lib.rpi.edu/record=b1480608'}
Extent
x, 278 p.
Isbn
9780819443472
Other physical details
ill.

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