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The Resource Nanoscale characterisation of ferroelectric materials : scanning probe microscopy approach, M. Alexe, A. Gruverman, eds

Nanoscale characterisation of ferroelectric materials : scanning probe microscopy approach, M. Alexe, A. Gruverman, eds

Label
Nanoscale characterisation of ferroelectric materials : scanning probe microscopy approach
Title
Nanoscale characterisation of ferroelectric materials
Title remainder
scanning probe microscopy approach
Statement of responsibility
M. Alexe, A. Gruverman, eds
Contributor
Subject
Language
eng
Member of
Cataloging source
DLC
Illustrations
illustrations
Index
index present
LC call number
TA418.9.N35
LC item number
N3445 2004
Literary form
non fiction
Nature of contents
bibliography
Series statement
Nanoscience and technology
Nanoscale characterisation of ferroelectric materials : scanning probe microscopy approach, M. Alexe, A. Gruverman, eds
Label
Nanoscale characterisation of ferroelectric materials : scanning probe microscopy approach, M. Alexe, A. Gruverman, eds
Publication
Related Contributor
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Related Agents
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Bibliography note
Includes bibliographical references and index
http://library.link/vocab/cover_art
https://contentcafe2.btol.com/ContentCafe/Jacket.aspx?Return=1&Type=S&Value=9783540206620&userID=ebsco-test&password=ebsco-test
Dimensions
24 cm.
http://library.link/vocab/discovery_link
{'f': 'http://opac.lib.rpi.edu/record=b1702546'}
Extent
xiii, 282 p.
Isbn
9783540206620
Isbn Type
(alk. paper)
Lccn
2004040666
Other physical details
ill. (some col.)

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