Coverart for item
The Resource Microsystems metrology and inspection : 15-16 June 1999, Munich, Germany, Christophe Gorecki, chair/editor ; sponsored by EOS--European Optical Society ... [et al.]

Microsystems metrology and inspection : 15-16 June 1999, Munich, Germany, Christophe Gorecki, chair/editor ; sponsored by EOS--European Optical Society ... [et al.]

Label
Microsystems metrology and inspection : 15-16 June 1999, Munich, Germany
Title
Microsystems metrology and inspection
Title remainder
15-16 June 1999, Munich, Germany
Statement of responsibility
Christophe Gorecki, chair/editor ; sponsored by EOS--European Optical Society ... [et al.]
Contributor
Subject
Genre
Language
eng
Member of
Cataloging source
CUS
Illustrations
illustrations
Index
index present
LC call number
TK7874
LC item number
.M48925 1999
Literary form
non fiction
Nature of contents
bibliography
Series statement
SPIE proceedings series,
Series volume
v. 3825
Microsystems metrology and inspection : 15-16 June 1999, Munich, Germany, Christophe Gorecki, chair/editor ; sponsored by EOS--European Optical Society ... [et al.]
Label
Microsystems metrology and inspection : 15-16 June 1999, Munich, Germany, Christophe Gorecki, chair/editor ; sponsored by EOS--European Optical Society ... [et al.]
Publication
Related Contributor
Related Location
Related Agents
Related Authorities
Related Subjects
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Bibliography note
Includes bibliographical references and author index
http://library.link/vocab/cover_art
https://contentcafe2.btol.com/ContentCafe/Jacket.aspx?Return=1&Type=S&Value=9780819433114&userID=ebsco-test&password=ebsco-test
Dimensions
28 cm.
http://library.link/vocab/discovery_link
{'f': 'http://opac.lib.rpi.edu/record=b1430600'}
Extent
v, 186 p.
Isbn
9780819433114
Lccn
00708945
Other physical details
ill.

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