Coverart for item
The Resource Microelectronic structures and MEMS for optical processing II : 14-15 October 1996, Austin, Texas, M. Edward Motamedi, Wayne Bailey, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering, SEMI--Semiconductor Equipment and Materials International [and] NIST--National Institute of Standards and Technology ; cooperating organizations, Solid State Technology [and] Sandia National Laboratories ; published by SPIE--the International Society for Optical Engineering

Microelectronic structures and MEMS for optical processing II : 14-15 October 1996, Austin, Texas, M. Edward Motamedi, Wayne Bailey, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering, SEMI--Semiconductor Equipment and Materials International [and] NIST--National Institute of Standards and Technology ; cooperating organizations, Solid State Technology [and] Sandia National Laboratories ; published by SPIE--the International Society for Optical Engineering

Label
Microelectronic structures and MEMS for optical processing II : 14-15 October 1996, Austin, Texas
Title
Microelectronic structures and MEMS for optical processing II
Title remainder
14-15 October 1996, Austin, Texas
Statement of responsibility
M. Edward Motamedi, Wayne Bailey, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering, SEMI--Semiconductor Equipment and Materials International [and] NIST--National Institute of Standards and Technology ; cooperating organizations, Solid State Technology [and] Sandia National Laboratories ; published by SPIE--the International Society for Optical Engineering
Contributor
Subject
Genre
Language
eng
Member of
Cataloging source
GAT
Illustrations
illustrations
Index
index present
Literary form
non fiction
Nature of contents
bibliography
Series statement
Proceedings / SPIE--the International Society for Optical Engineering
Series volume
v. 2881
Microelectronic structures and MEMS for optical processing II : 14-15 October 1996, Austin, Texas, M. Edward Motamedi, Wayne Bailey, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering, SEMI--Semiconductor Equipment and Materials International [and] NIST--National Institute of Standards and Technology ; cooperating organizations, Solid State Technology [and] Sandia National Laboratories ; published by SPIE--the International Society for Optical Engineering
Label
Microelectronic structures and MEMS for optical processing II : 14-15 October 1996, Austin, Texas, M. Edward Motamedi, Wayne Bailey, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering, SEMI--Semiconductor Equipment and Materials International [and] NIST--National Institute of Standards and Technology ; cooperating organizations, Solid State Technology [and] Sandia National Laboratories ; published by SPIE--the International Society for Optical Engineering
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Bibliography note
Includes bibliographical references and index
http://library.link/vocab/cover_art
https://contentcafe2.btol.com/ContentCafe/Jacket.aspx?Return=1&Type=S&Value=9780819422798&userID=ebsco-test&password=ebsco-test
Dimensions
28 cm.
http://library.link/vocab/discovery_link
{'f': 'http://opac.lib.rpi.edu/record=b1337366'}
Extent
v, 220 p.
Isbn
9780819422798
Lccn
96069475
Other physical details
ill.

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