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The Resource Microelectronic manufacturing yield, reliability, and failure analysis II : 16-17 October, 1996, Austin, Texas, Ali Keshavarzi, Sharad Prasad, Hans-Dieter Hartmann, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organizations, SEMI--Semiconductor Equipment and Materials International ... [et al.]

Microelectronic manufacturing yield, reliability, and failure analysis II : 16-17 October, 1996, Austin, Texas, Ali Keshavarzi, Sharad Prasad, Hans-Dieter Hartmann, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organizations, SEMI--Semiconductor Equipment and Materials International ... [et al.]

Label
Microelectronic manufacturing yield, reliability, and failure analysis II : 16-17 October, 1996, Austin, Texas
Title
Microelectronic manufacturing yield, reliability, and failure analysis II
Title remainder
16-17 October, 1996, Austin, Texas
Statement of responsibility
Ali Keshavarzi, Sharad Prasad, Hans-Dieter Hartmann, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organizations, SEMI--Semiconductor Equipment and Materials International ... [et al.]
Contributor
Subject
Genre
Language
eng
Member of
Cataloging source
MoKL
Illustrations
illustrations
Index
index present
Literary form
non fiction
Nature of contents
bibliography
Series statement
Proceedings / SPIE--the International Society for Optical Engineering
Series volume
v. 2874
Microelectronic manufacturing yield, reliability, and failure analysis II : 16-17 October, 1996, Austin, Texas, Ali Keshavarzi, Sharad Prasad, Hans-Dieter Hartmann, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organizations, SEMI--Semiconductor Equipment and Materials International ... [et al.]
Label
Microelectronic manufacturing yield, reliability, and failure analysis II : 16-17 October, 1996, Austin, Texas, Ali Keshavarzi, Sharad Prasad, Hans-Dieter Hartmann, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organizations, SEMI--Semiconductor Equipment and Materials International ... [et al.]
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Bibliography note
Includes bibliographic references and author index
http://library.link/vocab/cover_art
https://contentcafe2.btol.com/ContentCafe/Jacket.aspx?Return=1&Type=S&Value=9780819422729&userID=ebsco-test&password=ebsco-test
Dimensions
28 cm.
http://library.link/vocab/discovery_link
{'f': 'http://opac.lib.rpi.edu/record=b1338274'}
Extent
ix, 372 p.
Isbn
9780819422729
Lccn
96069469
Other physical details
ill.

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