Coverart for item
The Resource Microelectronic manufacturing yield, reliability, and failure analysis III : 1-2 October, 1997, Austin, Texas, Ali Keshavarzi, Sharad Prasad, Hans-Dieter Hartmann, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering ; cooperating organizations, SEMI--Semiconductor Equipment and Materials International, Solid State Technology, [and] the Electrochemical Society

Microelectronic manufacturing yield, reliability, and failure analysis III : 1-2 October, 1997, Austin, Texas, Ali Keshavarzi, Sharad Prasad, Hans-Dieter Hartmann, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering ; cooperating organizations, SEMI--Semiconductor Equipment and Materials International, Solid State Technology, [and] the Electrochemical Society

Label
Microelectronic manufacturing yield, reliability, and failure analysis III : 1-2 October, 1997, Austin, Texas
Title
Microelectronic manufacturing yield, reliability, and failure analysis III
Title remainder
1-2 October, 1997, Austin, Texas
Statement of responsibility
Ali Keshavarzi, Sharad Prasad, Hans-Dieter Hartmann, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering ; cooperating organizations, SEMI--Semiconductor Equipment and Materials International, Solid State Technology, [and] the Electrochemical Society
Contributor
Subject
Genre
Language
eng
Member of
Cataloging source
CUS
Illustrations
illustrations
Index
index present
Literary form
non fiction
Nature of contents
bibliography
Series statement
SPIE proceedings series
Series volume
v. 3216
Microelectronic manufacturing yield, reliability, and failure analysis III : 1-2 October, 1997, Austin, Texas, Ali Keshavarzi, Sharad Prasad, Hans-Dieter Hartmann, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering ; cooperating organizations, SEMI--Semiconductor Equipment and Materials International, Solid State Technology, [and] the Electrochemical Society
Label
Microelectronic manufacturing yield, reliability, and failure analysis III : 1-2 October, 1997, Austin, Texas, Ali Keshavarzi, Sharad Prasad, Hans-Dieter Hartmann, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering ; cooperating organizations, SEMI--Semiconductor Equipment and Materials International, Solid State Technology, [and] the Electrochemical Society
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Bibliography note
Includes bibliographic references and index
http://library.link/vocab/cover_art
https://contentcafe2.btol.com/ContentCafe/Jacket.aspx?Return=1&Type=S&Value=9780819426482&userID=ebsco-test&password=ebsco-test
Dimensions
28 cm.
http://library.link/vocab/discovery_link
{'f': 'http://opac.lib.rpi.edu/record=b1340974'}
Extent
viii, 198 p.
Isbn
9780819426482
Other physical details
ill.

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