Coverart for item
The Resource Materials reliability in microelectronics VII : symposium held March 31-April 3, 1997, San Francisco, California, U.S.A., editors, J. Joseph Clement ... [et al.]

Materials reliability in microelectronics VII : symposium held March 31-April 3, 1997, San Francisco, California, U.S.A., editors, J. Joseph Clement ... [et al.]

Label
Materials reliability in microelectronics VII : symposium held March 31-April 3, 1997, San Francisco, California, U.S.A.
Title
Materials reliability in microelectronics VII
Title remainder
symposium held March 31-April 3, 1997, San Francisco, California, U.S.A.
Statement of responsibility
editors, J. Joseph Clement ... [et al.]
Title variation
Materials reliability in microelectronics 7
Contributor
Subject
Genre
Language
eng
Member of
Cataloging source
LHL
Illustrations
illustrations
Index
index present
Literary form
non fiction
Nature of contents
bibliography
Series statement
Materials Research Society symposium proceedings
Series volume
v. 473
Materials reliability in microelectronics VII : symposium held March 31-April 3, 1997, San Francisco, California, U.S.A., editors, J. Joseph Clement ... [et al.]
Label
Materials reliability in microelectronics VII : symposium held March 31-April 3, 1997, San Francisco, California, U.S.A., editors, J. Joseph Clement ... [et al.]
Publication
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Bibliography note
Includes bibliographical references and indexes
http://library.link/vocab/cover_art
https://contentcafe2.btol.com/ContentCafe/Jacket.aspx?Return=1&Type=S&Value=9781558993778&userID=ebsco-test&password=ebsco-test
Dimensions
24 cm.
http://library.link/vocab/discovery_link
{'f': 'http://opac.lib.rpi.edu/record=b1358770'}
Extent
xv, 457 p.
Isbn
9781558993778
Other physical details
ill.

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