Coverart for item
The Resource Materials reliability in microelectronics VI : symposium held April 8-12, 1996, San Francisco, California, U.S.A., editors, William F. Filter ... [et al.]

Materials reliability in microelectronics VI : symposium held April 8-12, 1996, San Francisco, California, U.S.A., editors, William F. Filter ... [et al.]

Label
Materials reliability in microelectronics VI : symposium held April 8-12, 1996, San Francisco, California, U.S.A.
Title
Materials reliability in microelectronics VI
Title remainder
symposium held April 8-12, 1996, San Francisco, California, U.S.A.
Statement of responsibility
editors, William F. Filter ... [et al.]
Title variation
Materials reliability in microelectronics 6
Contributor
Subject
Genre
Language
eng
Member of
Cataloging source
GAT
Illustrations
illustrations
Index
index present
Literary form
non fiction
Nature of contents
bibliography
Series statement
Materials Research Society symposium proceedings
Series volume
v. 428
Materials reliability in microelectronics VI : symposium held April 8-12, 1996, San Francisco, California, U.S.A., editors, William F. Filter ... [et al.]
Label
Materials reliability in microelectronics VI : symposium held April 8-12, 1996, San Francisco, California, U.S.A., editors, William F. Filter ... [et al.]
Publication
Related Contributor
Related Location
Related Agents
Related Authorities
Related Subjects
Related Items
Bibliography note
Includes bibliographical references and indexes
http://library.link/vocab/cover_art
https://contentcafe2.btol.com/ContentCafe/Jacket.aspx?Return=1&Type=S&Value=9781558993310&userID=ebsco-test&password=ebsco-test
Dimensions
24 cm.
http://library.link/vocab/discovery_link
{'f': 'http://opac.lib.rpi.edu/record=b1330740'}
Extent
xv, 583 p.
Isbn
9781558993310
Other physical details
ill.

Library Locations

    • Folsom LibraryBorrow it
      110 8th St, Troy, NY, 12180, US
      42.729766 -73.682577
Processing Feedback ...