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The Resource Materials reliability in microelectronics V : symposium held April 17-21, 1995, San Francisco, California, U.S.A., editors, Anthony S. Oates ... (et al.)

Materials reliability in microelectronics V : symposium held April 17-21, 1995, San Francisco, California, U.S.A., editors, Anthony S. Oates ... (et al.)

Label
Materials reliability in microelectronics V : symposium held April 17-21, 1995, San Francisco, California, U.S.A.
Title
Materials reliability in microelectronics V
Title remainder
symposium held April 17-21, 1995, San Francisco, California, U.S.A.
Statement of responsibility
editors, Anthony S. Oates ... (et al.)
Title variation
Materials reliability in microelectronics 5
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Subject
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Series statement
Materials Research Society symposium proceedings
Series volume
v. 391
Materials reliability in microelectronics V : symposium held April 17-21, 1995, San Francisco, California, U.S.A., editors, Anthony S. Oates ... (et al.)
Label
Materials reliability in microelectronics V : symposium held April 17-21, 1995, San Francisco, California, U.S.A., editors, Anthony S. Oates ... (et al.)
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Bibliography note
Includes bibliographical references and index
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Dimensions
24 cm.
http://library.link/vocab/discovery_link
{'f': 'http://opac.lib.rpi.edu/record=b1324538'}
Extent
xv, 523 p.
Isbn
9781558992948
Other physical details
ill.

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