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The Resource Materials reliability in microelectronics II : symposium held April 27-May 1, 1992, San Francisco, California, U.S.A., editors, C.V. Thompson, J.R. Lloyd

Materials reliability in microelectronics II : symposium held April 27-May 1, 1992, San Francisco, California, U.S.A., editors, C.V. Thompson, J.R. Lloyd

Label
Materials reliability in microelectronics II : symposium held April 27-May 1, 1992, San Francisco, California, U.S.A.
Title
Materials reliability in microelectronics II
Title remainder
symposium held April 27-May 1, 1992, San Francisco, California, U.S.A.
Statement of responsibility
editors, C.V. Thompson, J.R. Lloyd
Title variation
Materials reliability in microelectronics 2
Contributor
Subject
Genre
Member of
Series statement
Materials Research Society symposium proceedings
Series volume
v. 265
Materials reliability in microelectronics II : symposium held April 27-May 1, 1992, San Francisco, California, U.S.A., editors, C.V. Thompson, J.R. Lloyd
Label
Materials reliability in microelectronics II : symposium held April 27-May 1, 1992, San Francisco, California, U.S.A., editors, C.V. Thompson, J.R. Lloyd
Publication
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Bibliography note
Includes bibliographical references and indexes
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Dimensions
24 cm.
http://library.link/vocab/discovery_link
{'f': 'http://opac.lib.rpi.edu/record=b1229377'}
Extent
ix, 328 p.
Isbn
9781558991606
Lccn
92-27362
Other physical details
ill.

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