Coverart for item
The Resource Laser interferometry : quantitative analysis of interferograms ; third in a series, 7-9 August 1989, San Diego, California, Ryszard J. Pryputniewicz, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, Applied Optics Laboratory/New Mexico State University ... (et al.)

Laser interferometry : quantitative analysis of interferograms ; third in a series, 7-9 August 1989, San Diego, California, Ryszard J. Pryputniewicz, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, Applied Optics Laboratory/New Mexico State University ... (et al.)

Label
Laser interferometry : quantitative analysis of interferograms ; third in a series, 7-9 August 1989, San Diego, California
Title
Laser interferometry
Title remainder
quantitative analysis of interferograms ; third in a series, 7-9 August 1989, San Diego, California
Statement of responsibility
Ryszard J. Pryputniewicz, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, Applied Optics Laboratory/New Mexico State University ... (et al.)
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Subject
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Series statement
Proceedings of SPIE--the International Society for Optical Engineering
Series volume
v. 1162
Laser interferometry : quantitative analysis of interferograms ; third in a series, 7-9 August 1989, San Diego, California, Ryszard J. Pryputniewicz, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, Applied Optics Laboratory/New Mexico State University ... (et al.)
Label
Laser interferometry : quantitative analysis of interferograms ; third in a series, 7-9 August 1989, San Diego, California, Ryszard J. Pryputniewicz, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, Applied Optics Laboratory/New Mexico State University ... (et al.)
Publication
Note
'Part of a four-conference program on Interferometry, Microscopy, and Testing held at SPIE's 33rd Annual International Symposium on Optical & Optoelectronic Applied Science & Engineering.'--p. vii
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Bibliography note
Includes bibliographical references and author index
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Dimensions
28 cm.
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Extent
ix, 468 p.
Isbn
9780819401984
Isbn Type
(pbk.)
Lccn
89-43272
Other physical details
ill.

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