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The Resource Laboratory Micro-X-Ray Fluorescence Spectroscopy : Instrumentation and Applications, by Michael Haschke, (electronic resource)

Laboratory Micro-X-Ray Fluorescence Spectroscopy : Instrumentation and Applications, by Michael Haschke, (electronic resource)

Label
Laboratory Micro-X-Ray Fluorescence Spectroscopy : Instrumentation and Applications
Title
Laboratory Micro-X-Ray Fluorescence Spectroscopy
Title remainder
Instrumentation and Applications
Statement of responsibility
by Michael Haschke
Creator
Contributor
Author
Subject
Language
eng
Summary
Micro-X-ray fluorescence offers the possibility for a position- sensitive and non-destructive analysis that can be used for the analysis of non-homogeneous materials and layer systems. This analytical technique has shown a dynamic development in the last 15 years and is used for the analysis of small particles, inclusions, of elemental distributions for a wide range of different applications both in research and quality control. The first experiments were performed on synchrotrons but there is a requirement for laboratory instruments which offers a fast and immediate access for analytical results. The book discuss the main components of a æ-XRF instrument and the different measurement modes, it gives an overview about the various instruments types, considers the special requirements for quantification of non-homogeneous materials and presents a wide range of application for single point and multi-point analysis as well as for distribution analysis in one, two and three dimensions
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Is part of
Image bit depth
0
Literary form
non fiction
Series statement
Springer Series in Surface Sciences,
Series volume
55
Laboratory Micro-X-Ray Fluorescence Spectroscopy : Instrumentation and Applications, by Michael Haschke, (electronic resource)
Label
Laboratory Micro-X-Ray Fluorescence Spectroscopy : Instrumentation and Applications, by Michael Haschke, (electronic resource)
Link
http://libproxy.rpi.edu/login?url=http://dx.doi.org/10.1007/978-3-319-04864-2
Publication
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Antecedent source
mixed
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Color
not applicable
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Contents
XRF-Basics -- Main Components of X-Ray Spectrometers -- Special Requirements for æ-XRF -- Quantification -- Sample Preparation -- Relations to Other Analytical Methods -- Applications
http://library.link/vocab/cover_art
https://contentcafe2.btol.com/ContentCafe/Jacket.aspx?Return=1&Type=S&Value=9783319048642&userID=ebsco-test&password=ebsco-test
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unknown
http://library.link/vocab/discovery_link
{'f': 'http://opac.lib.rpi.edu/record=b3556753'}
Extent
XVIII, 356 p. 254 illus., 107 illus. in color.
File format
multiple file formats
Form of item
electronic
Isbn
9783319048642
Level of compression
uncompressed
Media category
computer
Media MARC source
rdamedia
Media type code
c
Other physical details
online resource.
Quality assurance targets
absent
Reformatting quality
access
Specific material designation
remote

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