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The Resource Integrating photogrammetric techniques with scene analysis and machine vision : 14-15 April 1993, Orlando, Florida, Eamon B. Barrett, David M. McKeown, Jr., chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organizations, ARPA--Advanced Research Projects Agency, ASPRS--American Society for Photogrammetry and Remote Sensing

Integrating photogrammetric techniques with scene analysis and machine vision : 14-15 April 1993, Orlando, Florida, Eamon B. Barrett, David M. McKeown, Jr., chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organizations, ARPA--Advanced Research Projects Agency, ASPRS--American Society for Photogrammetry and Remote Sensing

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Integrating photogrammetric techniques with scene analysis and machine vision : 14-15 April 1993, Orlando, Florida
Title
Integrating photogrammetric techniques with scene analysis and machine vision
Title remainder
14-15 April 1993, Orlando, Florida
Statement of responsibility
Eamon B. Barrett, David M. McKeown, Jr., chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organizations, ARPA--Advanced Research Projects Agency, ASPRS--American Society for Photogrammetry and Remote Sensing
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Series statement
Proceedings / SPIE--the International Society for Optical Engineering
Series volume
v. 1944
Integrating photogrammetric techniques with scene analysis and machine vision : 14-15 April 1993, Orlando, Florida, Eamon B. Barrett, David M. McKeown, Jr., chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organizations, ARPA--Advanced Research Projects Agency, ASPRS--American Society for Photogrammetry and Remote Sensing
Label
Integrating photogrammetric techniques with scene analysis and machine vision : 14-15 April 1993, Orlando, Florida, Eamon B. Barrett, David M. McKeown, Jr., chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organizations, ARPA--Advanced Research Projects Agency, ASPRS--American Society for Photogrammetry and Remote Sensing
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Bibliography note
Includes bibliographical references and author index
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Dimensions
28 cm.
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{'f': 'http://opac.lib.rpi.edu/record=b1242663'}
Extent
viii, 286 p.
Isbn
9780819411808
Isbn Type
(pbk.)
Lccn
93-84057
Other physical details
ill.

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