Coverart for item
The Resource Integrating photogrammetric techniques with scene analysis and machine vision III : 21-23 April, 1997, Orlando, Florida, David M. McKeown, Jr., J. Chris McGlone, Olivier Jamet, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organization International Society for Photogrammetry and Remote Sensing

Integrating photogrammetric techniques with scene analysis and machine vision III : 21-23 April, 1997, Orlando, Florida, David M. McKeown, Jr., J. Chris McGlone, Olivier Jamet, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organization International Society for Photogrammetry and Remote Sensing

Label
Integrating photogrammetric techniques with scene analysis and machine vision III : 21-23 April, 1997, Orlando, Florida
Title
Integrating photogrammetric techniques with scene analysis and machine vision III
Title remainder
21-23 April, 1997, Orlando, Florida
Statement of responsibility
David M. McKeown, Jr., J. Chris McGlone, Olivier Jamet, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organization International Society for Photogrammetry and Remote Sensing
Contributor
Subject
Genre
Language
eng
Member of
Cataloging source
LHL
Illustrations
illustrations
Index
index present
Literary form
non fiction
Nature of contents
bibliography
Series statement
Proceedings / SPIE--the International Society for optical Engineering
Series volume
v. 3072
Integrating photogrammetric techniques with scene analysis and machine vision III : 21-23 April, 1997, Orlando, Florida, David M. McKeown, Jr., J. Chris McGlone, Olivier Jamet, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organization International Society for Photogrammetry and Remote Sensing
Label
Integrating photogrammetric techniques with scene analysis and machine vision III : 21-23 April, 1997, Orlando, Florida, David M. McKeown, Jr., J. Chris McGlone, Olivier Jamet, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organization International Society for Photogrammetry and Remote Sensing
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Bibliography note
Includes bibliographic references and author index
http://library.link/vocab/cover_art
https://contentcafe2.btol.com/ContentCafe/Jacket.aspx?Return=1&Type=S&Value=9780819424877&userID=ebsco-test&password=ebsco-test
Dimensions
28 cm.
http://library.link/vocab/discovery_link
{'f': 'http://opac.lib.rpi.edu/record=b1340982'}
Extent
xi, 338 p.
Isbn
9780819424877
Other physical details
ill.

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