Coverart for item
The Resource In-situ Materials Characterization : Across Spatial and Temporal Scales, edited by Alexander Ziegler, Heinz Graafsma, Xiao Feng Zhang, Joost W.M. Frenken, (electronic resource)

In-situ Materials Characterization : Across Spatial and Temporal Scales, edited by Alexander Ziegler, Heinz Graafsma, Xiao Feng Zhang, Joost W.M. Frenken, (electronic resource)

Label
In-situ Materials Characterization : Across Spatial and Temporal Scales
Title
In-situ Materials Characterization
Title remainder
Across Spatial and Temporal Scales
Statement of responsibility
edited by Alexander Ziegler, Heinz Graafsma, Xiao Feng Zhang, Joost W.M. Frenken
Creator
Contributor
Editor
Subject
Language
eng
Summary
The behavior of nanoscale materials can change rapidly with time either because the environment changes rapidly, or because the influence of the environment propagates quickly across the intrinsically small dimensions of nanoscale materials. Extremely fast time resolution studies using X-rays, electrons and neutrons are of very high interest to many researchers and is a fast-evolving and interesting field for the study of dynamic processes. Therefore, in situ structural characterization and measurements of structure-property relationships covering several decades of length and time scales (from atoms to millimeters and femtoseconds to hours) with high spatial and temporal resolutions are crucially important to understand the synthesis and behavior of multidimensional materials. The techniques described in this book will permit access to the real-time dynamics of materials, surface processes, and chemical and biological reactions at various time scales. This book provides an interdisciplinary reference for research using in situ techniques to capture the real-time structural and property responses of materials to surrounding fields using electron, optical, and x-ray microscopies (e.g., scanning, transmission, and low-energy electron microscopy, and scanning probe microscopy), or in the scattering realm with x-ray, neutron and electron diffraction
Member of
Is part of
Image bit depth
0
Literary form
non fiction
Series statement
Springer Series in Materials Science,
Series volume
193
In-situ Materials Characterization : Across Spatial and Temporal Scales, edited by Alexander Ziegler, Heinz Graafsma, Xiao Feng Zhang, Joost W.M. Frenken, (electronic resource)
Label
In-situ Materials Characterization : Across Spatial and Temporal Scales, edited by Alexander Ziegler, Heinz Graafsma, Xiao Feng Zhang, Joost W.M. Frenken, (electronic resource)
Link
http://libproxy.rpi.edu/login?url=http://dx.doi.org/10.1007/978-3-642-45152-2
Publication
Related Contributor
Related Location
Related Agents
Related Authorities
Related Subjects
Related Items
Antecedent source
mixed
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Color
not applicable
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Contents
Scanning Probe Microscopy on 'Live' Catalysts -- In-situ X-ray diffraction at synchrotron and Free-Electron-Laser sources -- Advanced in situ transmission electron microscopy -- Ultra-fast TEM and Electron Diffraction -- In-Situ Materials Characterization with FIB/SEM -- In-situ X-ray photoelectron spectroscopy -- 2Real-time3 probing of photo-induced molecular processes in liquids by ultrafast  X-ray absorption spectroscopy -- Time-Resolved Neutron Scattering -- Novel Detectors for Ultra-fast XRD, TEM and ED Characterization
http://library.link/vocab/cover_art
https://contentcafe2.btol.com/ContentCafe/Jacket.aspx?Return=1&Type=S&Value=9783642451522&userID=ebsco-test&password=ebsco-test
Dimensions
unknown
http://library.link/vocab/discovery_link
{'f': 'http://opac.lib.rpi.edu/record=b3552200'}
Extent
XI, 256 p. 124 illus., 78 illus. in color.
File format
multiple file formats
Form of item
electronic
Isbn
9783642451522
Level of compression
uncompressed
Media category
computer
Media MARC source
rdamedia
Media type code
c
Other physical details
online resource.
Quality assurance targets
absent
Reformatting quality
access
Specific material designation
remote

Library Locations

    • Folsom LibraryBorrow it
      110 8th St, Troy, NY, 12180, US
      42.729766 -73.682577
Processing Feedback ...