Coverart for item
The Resource In-process optical metrology for precision machining : 31 March-2 April 1987, The Hague, The Netherlands, Peter Langenbeck, chair/editor ; organized by ANRT--Association Nationale de la Recherche Technique, SPIE--the International Society for Optical Engineering ; cooperating sponsors: Comite Belge d'Optique ... (et at.)

In-process optical metrology for precision machining : 31 March-2 April 1987, The Hague, The Netherlands, Peter Langenbeck, chair/editor ; organized by ANRT--Association Nationale de la Recherche Technique, SPIE--the International Society for Optical Engineering ; cooperating sponsors: Comite Belge d'Optique ... (et at.)

Label
In-process optical metrology for precision machining : 31 March-2 April 1987, The Hague, The Netherlands
Title
In-process optical metrology for precision machining
Title remainder
31 March-2 April 1987, The Hague, The Netherlands
Statement of responsibility
Peter Langenbeck, chair/editor ; organized by ANRT--Association Nationale de la Recherche Technique, SPIE--the International Society for Optical Engineering ; cooperating sponsors: Comite Belge d'Optique ... (et at.)
Contributor
Subject
Genre
Member of
Series statement
Proceedings of SPIE--the International Society for Optical Engineering
Series volume
v. 802
In-process optical metrology for precision machining : 31 March-2 April 1987, The Hague, The Netherlands, Peter Langenbeck, chair/editor ; organized by ANRT--Association Nationale de la Recherche Technique, SPIE--the International Society for Optical Engineering ; cooperating sponsors: Comite Belge d'Optique ... (et at.)
Label
In-process optical metrology for precision machining : 31 March-2 April 1987, The Hague, The Netherlands, Peter Langenbeck, chair/editor ; organized by ANRT--Association Nationale de la Recherche Technique, SPIE--the International Society for Optical Engineering ; cooperating sponsors: Comite Belge d'Optique ... (et at.)
Publication
Note
'Conference 802, In-process optical metrology for precision machining, was one of fifteen topical meetings at the fourth International Symposium on Optical and Optoelectronic Applied Science and Engineering, 30 March-3 April 1987, The Hague, The Netherlands.'--P. v
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Bibliography note
Includes bibliographies and author index
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Dimensions
28 cm.
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{'f': 'http://opac.lib.rpi.edu/record=b1167002'}
Extent
viii, 217 p.
Isbn
9780892528370
Lccn
87-61552
Other physical details
ill.

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