Coverart for item
The Resource High-speed inspection architectures, barcoding, and character recognition : 5-7 November 1990, Boston, Massachusetts, Michael J. Chen, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering

High-speed inspection architectures, barcoding, and character recognition : 5-7 November 1990, Boston, Massachusetts, Michael J. Chen, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering

Label
High-speed inspection architectures, barcoding, and character recognition : 5-7 November 1990, Boston, Massachusetts
Title
High-speed inspection architectures, barcoding, and character recognition
Title remainder
5-7 November 1990, Boston, Massachusetts
Statement of responsibility
Michael J. Chen, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering
Contributor
Subject
Genre
Member of
Series statement
Proceedings / SPIE--the International Society for Optical Engineering
Series volume
v. 1384
High-speed inspection architectures, barcoding, and character recognition : 5-7 November 1990, Boston, Massachusetts, Michael J. Chen, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering
Label
High-speed inspection architectures, barcoding, and character recognition : 5-7 November 1990, Boston, Massachusetts, Michael J. Chen, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering
Publication
Note
'Part of a four-conference program on Machine Vision System Integration held at SPIE's Symposium on Advances in Intelligent Systems, a part of OE/Boston '90, 4-9 November 1990, in Boston, Massachusetts'--P. viii
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Bibliography note
Includes bibliographical references and index
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Dimensions
28 cm.
http://library.link/vocab/discovery_link
{'f': 'http://opac.lib.rpi.edu/record=b1213553'}
Extent
ix, 355 p.
Isbn
9780819404510
Lccn
90-64017
Other physical details
ill.

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