Coverart for item
The Resource High-resolution wavefront control : methods, devices and applications III : 1-3 August, 2001, San Diego, [California] USA, John D. Gonglewski, Mikhail A. Vorontsov, Mark T. Gruneisen, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering

High-resolution wavefront control : methods, devices and applications III : 1-3 August, 2001, San Diego, [California] USA, John D. Gonglewski, Mikhail A. Vorontsov, Mark T. Gruneisen, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering

Label
High-resolution wavefront control : methods, devices and applications III : 1-3 August, 2001, San Diego, [California] USA
Title
High-resolution wavefront control
Title remainder
methods, devices and applications III : 1-3 August, 2001, San Diego, [California] USA
Statement of responsibility
John D. Gonglewski, Mikhail A. Vorontsov, Mark T. Gruneisen, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering
Contributor
Subject
Genre
Language
eng
Member of
Cataloging source
LHL
Illustrations
illustrations
Index
index present
Literary form
non fiction
Nature of contents
bibliography
Series statement
SPIE proceedings series
Series volume
v. 4493
High-resolution wavefront control : methods, devices and applications III : 1-3 August, 2001, San Diego, [California] USA, John D. Gonglewski, Mikhail A. Vorontsov, Mark T. Gruneisen, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering
Label
High-resolution wavefront control : methods, devices and applications III : 1-3 August, 2001, San Diego, [California] USA, John D. Gonglewski, Mikhail A. Vorontsov, Mark T. Gruneisen, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering
Publication
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Bibliography note
Includes bibliographic references and author index
http://library.link/vocab/cover_art
https://contentcafe2.btol.com/ContentCafe/Jacket.aspx?Return=1&Type=S&Value=9780819442079&userID=ebsco-test&password=ebsco-test
Dimensions
28 cm.
http://library.link/vocab/discovery_link
{'f': 'http://opac.lib.rpi.edu/record=b1430590'}
Extent
viii, 296 p.
Isbn
9780819442079
Other physical details
ill.

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